SAMPLE TEST REPORT

Project: MC3281
Prepared For: Mr. John Smith ABC Glove Company

January 13, 2001

 



Request

Particle cleanliness, extractable matter and ESD testing of cleanroom gloves


Sample Description

1) 9" nitrile gloves - blue
2) 9" latex gloves - yellow
3) 9" vinyl gloves - white translucent


Test Method

Particle cleanliness testing was performed in accordance with IEST-RP-CC005.2. Three gloves from each product were rinsed (inside and outside) with 700 ml of ultrapure DI water. A HIAC Model 8103 Liquid Particle Counter was used for the analysis of the rinse water. Results are reported as particles >0.5um/sq.cm and are corrected for the method blank.

Extractable matter (NVR and ion) testing was performed in accordance with IEST-RP-CC005.2 (short term extraction method). Three gloves of each product were extracted together in 1000 ml of ultrapure DI water.Non-volatile residues were determined gravimetrically. Ion concentrations were determined by Ion Chromatography. Results are reported in ppm (ug/g) and are corrected for the method blank.

ESD testing was performed on one glove of each product following preconditioning for 24 hours at 72 degrees F and 50% RH. Surface resistivity testing was performed in accordance with ASTM D257. Results are reported as the average of four test areas. Static decay time was determined in accordance with FTM 101c, Method 4046.1. Results are reported as the average of three decay runs from 5000v to 50v (technical zero).


Results

Test results are reported in the attached table.


Discussion

Nitrile Gloves

The nitrile gloves exhibited particle counts and NVR levels typical of gloves used in Class 100 cleanrooms. Extractable ion testing revealed slightly elevated levels of sodium, chloride and phosphate. Surface resistivity and static decay time place the glove in the static dissipative range.

Latex Gloves

Particle counts on the latex gloves are typical of gloves used in Class 1000 cleanrooms. The NVR level (>500 ppm) is of concern in the disc drive and microelectronics industries. Extractable ion testing indicates that much of the non-volatile residue is due to chloride. Other extractable ions are at normal levels. The surface resistivity and static decay times places this glove in the anti-static range.

Vinyl Gloves

Particle counts on the vinyl gloves are slightly higher than those found on other vinyl gloves commonly used in cleanrooms. The particle and NVR levels indicate that the gloves are Class 100 compatible. Extractable sodium and chloride levels are elevated, indicating possible salt contamination. The surface resistivity and static decay time place the glove in the static dissipative range.


Recommendations

While the nitrile and vinyl gloves are Class 100 compatible, their quality could be improved through reduction in particles and/or ions. The nitrile gloves could have the levels of sodium, chloride and phosphate reduced through examination of the manufacturing process and elimination or reduction of the chemicals containing these components. Higher than normal particle counts on the vinyl gloves may be due to vinyl dust, generated during packout.

The high particle, NVR and chloride level on the latex gloves could be indicative of overchlorination.

 



Project MC3281
Client: ABC Glove Co.
 
Test Results
Nitrile Gloves Latex Gloves Vinyl Gloves
Weight, g AVG. 5.87 6.13 6.02
Area, sq. cm AVG. 1128 1150 1190
Particles #1 920 2376 1002
>0.5um/sq.cm #2 875 3002 882
#3 770 3576 902
AVG. 855 2985 929
NVR in DI water, AVG. 202 508 190
ppm (ug/g)
Extractable Ions, Sodium 28.1 3.2 30.6
ppm (ug/g) Potassium 9.3 2.7 4.8
AVG. Calcium 8.6 8.2 6.9
Magnesium 2.1 1.6 2.0
Ammonium 4.0 2.8 ND<1.1
Lithium ND<0.1 ND<0.1 ND<0.1
Chloride 20.6 306.4 98.8
Fluoride ND<1.2 ND<1.1 ND<1.1
Bromide ND<1.2 ND<1.1 ND<1.1
Nitrite ND<1.2 ND<1.1 ND<1.1
Nitrate 3.3 2.6 ND<1.1
Sulfate ND<1.2 ND<1.1 ND<1.1
o-Phosphate 28.7 ND<1.1 ND<1.1
ESD, Surface Resistivity AVG. 2.0 x 10^9 .0 x 10^10 21.0 x 10^8
Ohms/square
 
ESD, Static Decay Time AVG. 0.71 0.80 0.43
Seconds
ND = None detected (below detection limit of instrument)



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